Passive Component — Category 01
Resistors
Opposition to current flow. The most fundamental passive component in all electronic circuits.
Function

Resistors limit current flow and create voltage drops according to Ohm's Law (V = IR). They are used for biasing transistors, voltage division, current limiting for LEDs, pull-up/pull-down duties, and impedance matching. Their value is measured in Ohms (Ω), kΩ, or MΩ.

Common Failures
  • Open circuit (burnt from overcurrent)
  • Value drift — resistance increases over time from heat stress or age
  • Cracked body (mechanical stress)
  • SMD: lifted pads or tombstoning from thermal shock
  • Cold solder joints causing intermittent faults
  • Carbon film: noisy / intermittent if carbon layer damaged
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Identification
  • Through-hole: Cylindrical body, axial leads, colour-coded bands (4 or 5 bands)
  • SMD: Small rectangular chip (0402–2512), numeric code (e.g., "103" = 10kΩ) or E96 code
  • Wire-wound: Ceramic body, used in high-power circuits
  • PCB marking: Prefix "R" (e.g., R12, R45)
  • Symbol: Rectangle (IEC) or zigzag (ANSI/US)
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Quick Test Summary
  • Mode: Ω (Resistance)
  • Power must be OFF
  • Capacitors must be discharged
  • Lift one leg for accurate in-circuit reading
  • Compare reading to colour code / silkscreen
  • OL = open / burnt. 0Ω = shorted
Schematic Symbols & Physical Appearance
IEC Symbol
ANSI/US Symbol
Through-Hole (4-band)
103
SMD 0805
Colour Code Reference
BLK=0 BRN=1 RED=2 ORG=3 YEL=4 GRN=5 BLU=6 VIO=7 GRY=8 WHT=9 Formula: (Band1)(Band2) × 10^(Band3) Ω | Tolerance: Gold=±5% Silver=±10% Brown=±1%
Multimeter Testing — Step by Step
1
Set DMM Mode
Turn dial to Ω (Resistance). Select a range above the expected value, or use Auto-Range. Ensure power to the circuit is OFF and all capacitors are discharged.
2
Isolate the Component
For accurate readings, lift one leg of the resistor from the PCB. Parallel paths in-circuit will pull the reading down, giving a false low value.
3
Probe & Read
Place probes across both resistor leads (polarity does not matter). Read the display and compare to colour code or silkscreen value.
PASS: Within ±5–10% of rated value
FAIL: OL = open/burnt resistor
FAIL: ~0Ω = shorted (rare, usually external short)
4
Zero Check
Touch probes together first — note any lead resistance (typically 0.1–0.3 Ω). Subtract this from low-value readings (e.g., sense resistors <1 Ω).
Passive Ω Mode Universal R = V/I Tolerance ±1–10%
Passive Component — Category 02
Capacitors
Energy storage in an electric field. Blocks DC, passes AC. Used for filtering, bypassing, timing, and coupling.
Function

Capacitors store and release electrical energy in an electric field between two conductive plates separated by a dielectric. They block DC while passing AC signals, filter power supply noise, couple AC stages, set timing in RC circuits, and provide bypass/decoupling functions. Value measured in Farads (F), µF, nF, pF.

Common Failures
  • Electrolytic: bulging top vent, leaking electrolyte
  • ESR increase — causes ripple on power rails
  • Capacitance loss — value falls below rated (drying out)
  • Tantalum: short-circuits under voltage spike or reverse polarity
  • Ceramic: cracked body from flex or thermal shock
  • Full short: 0Ω across terminals (dangerous)
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Identification
  • Electrolytic: Cylindrical, polarity marked (negative stripe/short lead)
  • Ceramic: Small disc or SMD chip (e.g., "104" = 100nF)
  • Tantalum: Teardrop/bead shape, marked with "+" for positive
  • Film: Rectangular, often yellow/orange, high-voltage
  • PCB marking: Prefix "C" (e.g., C4, C22)
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Quick Test Summary
  • Mode: Capacitance (–|–) or Diode mode
  • Power OFF, cap fully discharged before testing
  • Check for short with Ω mode first
  • Electrolytic: observe charge/discharge in Ω mode
  • Compare reading to rated µF/nF value
  • <80% rated = degraded; 0Ω = shorted
Schematic Symbols & Types
Non-polar
+
Polarised (Electrolytic)
+
Electrolytic
SMD Ceramic
+ 10µF
Tantalum
SMD Ceramic Capacitor Code
Code "104" → 10 × 10⁴ pF = 100,000 pF = 100nF = 0.1µF Code "472" → 47 × 10² pF = 4700 pF = 4.7nF
Multimeter Testing — Step by Step
1
Safety: Discharge First
ALWAYS discharge capacitors before touching leads. Short the terminals through a 1kΩ resistor for small caps; use a bleed resistor for large/HV caps. A charged electrolytic can deliver a painful or dangerous shock.
2
Short-Circuit Check (Ω Mode)
First, set DMM to Ω mode. Probe across the cap. A value of 0Ω or very low resistance means a dead short — the cap must be replaced immediately.
0Ω = Shorted Capacitor — Replace!
3
Capacitance Mode (if available)
Switch to –|– (capacitance) mode. Connect probes observing polarity for electrolytics (red = +). Compare reading to rated value printed on the body.
PASS: Within 80–120% of rated value
FAIL: <70% rated = dried out / degraded
4
Charge/Discharge Method (Ω Mode)
In Ω mode, probing a large electrolytic (≥100µF) will show the resistance briefly rise from low to OL as the DMM voltage charges the cap. This confirms the capacitor is functional.
Large cap: resistance climbs to OL = Good
Stays at 0Ω = Shorted. Stays at OL immediately = Open
Passive –|– Mode Ω Short Check Blocks DC Q = CV
Semiconductor — Category 03
Diodes
One-way current valve. Permits current in one direction only. Available as rectifier, Zener, Schottky, LED, and more.
Function

A P-N junction semiconductor that allows current to flow in one direction (forward bias) and blocks it in the other (reverse bias). Used for rectification (AC→DC), voltage clamping, protection against reverse polarity, signal demodulation, and as voltage references (Zener). Forward voltage drop: Si ≈ 0.6–0.7V, Schottky ≈ 0.2–0.4V, Ge ≈ 0.3V.

Common Failures
  • Short circuit (low resistance both directions) — from over-voltage or surge
  • Open circuit — from overcurrent burn-out
  • Leakage — conducts slightly in reverse bias (aging)
  • Zener: voltage reference drift
  • LED: open circuit (no light), usually over-current failure
  • Bridge rectifier: one or more diodes fail open or shorted
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Identification
  • Through-hole: Glass or plastic cylinder, cathode marked by silver/grey band
  • SMD: Small SOD-323/SOD-123 package, cathode marked by a line
  • LED: Clear/coloured lens, longer lead = anode (+)
  • Bridge rectifier: Square component with 4 pins (AC, AC, +, −)
  • PCB marking: Prefix "D" (e.g., D3, D14)
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Quick Test Summary
  • Mode: Diode ⊢ (diode test)
  • Power OFF, circuit discharged
  • Forward: Red→Anode, Black→Cathode → 0.3–0.7V
  • Reverse: Red→Cathode, Black→Anode → OL
  • Short: both directions ~0V = shorted
  • Open: both directions OL = open circuit
Schematic Symbols & Types
Standard Diode
Zener Diode
LED
1N4007 K A
1N4007 (Rectifier)
Diode Types — Forward Voltage Reference
Schottky: 0.2–0.4V Silicon: 0.6–0.7V Germanium: 0.25–0.35V LED: 1.8–3.5V Forward Voltage (Vf) measured in Diode Test mode. OL in reverse direction = PASS
Multimeter Testing — Diode Mode
1
Set to Diode Mode ⊢
Switch the DMM to the Diode Test symbol (⊢ or diode symbol). Power must be OFF. The diode must be removed or at least one leg lifted for an in-circuit test.
2
Forward Bias Test
Red probe → Anode (+). Black probe → Cathode (−). Display should show the forward voltage drop (Vf).
Silicon: 0.55–0.75V ✓
Schottky: 0.15–0.45V ✓
~0V = Shorted diode
3
Reverse Bias Test
Reverse the probes: Red → Cathode, Black → Anode. A healthy diode blocks reverse current.
OL (Over Limit) = PASS — reverse blocking ✓
Low reading (<1V) = Leaky or shorted diode
4
Zener Diode Note
Zener diodes test like regular diodes in diode mode. To verify the Zener voltage, you need a DC power supply set above the Zener voltage with a current-limiting resistor. Measure voltage across the Zener — it should clamp at its rated voltage (e.g., 5.1V, 12V).
Zener test requires external PSU + resistor
Semiconductor Diode Mode ⊢ P-N Junction Vf = 0.6–0.7V Si Rectifier / Protection
Semiconductor — Category 04
Bipolar Junction Transistors (BJT)
Current-controlled amplifier and switch. NPN and PNP types. Three terminals: Base, Collector, Emitter.
Function

A BJT is a current-controlled semiconductor device. A small base current (IB) controls a much larger collector current (IC), with the ratio known as the current gain (hFE or β, typically 100–500). Used as amplifiers in analogue circuits and as electronic switches in digital logic, motor drivers, and relay drivers. NPN: common emitter switch; PNP: high-side switch.

Common Failures
  • C-E short circuit — from thermal runaway or over-voltage
  • B-E or B-C junction open — from ESD or overcurrent
  • hFE (gain) degradation — junction damaged, still partially works
  • Thermal runaway in power BJTs without heatsink
  • Wrong pinout substitution — package pinout varies by part number
  • Oscillation instability — in RF transistors
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Identification
  • TO-92: D-shaped plastic body, 3 pins (CBE or EBC — check datasheet)
  • TO-220: Larger, with metal tab — power transistors
  • SOT-23: SMD, 3-pin, very small
  • Markings: Part number on body (e.g., 2N2222, BC547, 2SC945)
  • PCB prefix: "Q" (e.g., Q1, Q3)
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Quick Test Summary
  • Mode: Diode ⊢ for junction tests
  • Mode: hFE socket for gain (if DMM has it)
  • Test two P-N junctions: B-E and B-C
  • NPN: Red to Base for both = 0.6–0.7V
  • PNP: Black to Base for both = 0.6–0.7V
  • C-E in both directions = OL (must not conduct)
Symbols & Packages
C E B
NPN BJT
C E B
PNP BJT
E B C BC547
TO-92 Package
Junction Structure Diagram
N (Emitter) P (Base) N (Collector) NPN: IB controls IC IC = β × IB (β=hFE)
Multimeter Testing — BJT
1
Find the Base Pin
Look up pinout in datasheet (critical — varies by part). For NPN: place Red probe on Base, Black probe on Emitter then Collector in turn. Both should read Vf ≈ 0.6–0.7V.
NPN — Red(B)→Black(E or C): 0.6–0.7V ✓
2
Reverse Junction Test
Reverse probes (Black on Base, Red on E or C). Both junctions should block — reading should be OL in both positions.
Both reversed = OL ✓
Low value in reverse = leaky junction
3
Collector–Emitter Test
With base unconnected, probe Collector to Emitter (both polarities). A healthy BJT reads OL — no conduction without base drive.
C–E (both directions) = OL ✓
Low resistance C–E = Shorted transistor
4
Gain Test (hFE Socket)
If your DMM has an hFE socket, insert the transistor into the correct NPN/PNP holes. The meter displays the DC current gain (β). Compare to datasheet minimum value.
Typical small signal hFE: 100–500
Semiconductor Diode Mode ⊢ hFE/β = gain NPN / PNP Current Controlled
Semiconductor — Category 05
MOSFETs / Field-Effect Transistors
Voltage-controlled switch and amplifier. Gate, Drain, Source terminals. Used in power electronics, motor drives, and switching regulators.
Function

A MOSFET is a voltage-controlled transistor. Gate voltage (VGS) controls the channel conductivity between Drain and Source. N-channel: positive VGS turns it ON. P-channel: negative VGS turns it ON. Key advantage over BJT: extremely high input impedance (gate), very fast switching, and low on-resistance (RDS(on)). Widely used in SMPS, H-bridges, and logic-level switching.

Common Failures
  • Gate oxide breakdown — from ESD or over-voltage on gate (max ±20V typically)
  • D-S short circuit — thermal runaway or avalanche breakdown
  • Partial conduction (linear mode heating) — improper gate drive signal
  • Latch-up in parasitic BJT structure
  • Gate-source short — ESD punch-through of thin oxide
  • RDS(on) increase at high temperature
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Identification
  • TO-220: Tab + 3 pins; part number on body (e.g., IRF540, IRFZ44N)
  • D2PAK / TO-263: SMD power package
  • SOT-23: Small SMD FET (logic-level)
  • DFN/QFN: Low-profile SMD for high-efficiency converters
  • PCB prefix: "Q" or "T" (e.g., Q2, T4)
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Quick Test Summary
  • Mode: Diode ⊢
  • Body diode: D to S (N-ch) = 0.4–0.7V
  • Charge gate with Red probe to turn on channel
  • D to S should then read near-0 (conducting)
  • G-S: both directions OL (no junction)
  • D-S in both directions initially OL before gate charge
MOSFET Symbols & Package
D S G
N-Channel MOSFET
G D S IRF540N
TO-220 Package
Body Diode — N-Channel
Body diode: exists between D and S (cathode = Drain for N-ch) D→S in diode mode = 0.4–0.7V (body diode forward) S→D = OL | G-S = OL | G-D = OL
Multimeter Testing — MOSFET
1
Identify Pins & Discharge Gate
Find Gate, Drain, Source from datasheet. Briefly short Gate to Source to discharge any built-up gate charge before starting tests. This ensures the MOSFET starts in the OFF state.
2
Body Diode Test (Diode Mode)
Red probe → Drain, Black probe → Source (N-ch). Should read the body diode forward voltage. Reverse probes: should read OL.
Red(D)→Black(S): 0.4–0.7V ✓ | Reversed: OL ✓
Both directions 0V = D-S shorted
3
Gate-Source / Gate-Drain
Probe G-S and G-D in both directions. There is no P-N junction at the gate (oxide insulated), so both should read OL in both directions.
G-S both directions = OL ✓
G-S low resistance = Gate oxide destroyed
4
Gate Charge Turn-On Test
Touch Red probe to Gate (charging gate capacitance from DMM). Then probe D-S: MOSFET should now conduct, showing low resistance or near-0Ω. Discharge gate (short G-S), re-test: should return to OL.
D-S after gate charge: low resistance ✓
D-S after G-S short: OL ✓ (turns OFF)
Semiconductor Diode Mode ⊢ Voltage Controlled N-ch / P-ch Gate Oxide Sensitive
Passive Component — Category 06
Inductors & Coils
Stores energy in a magnetic field. Opposes changes in current. Used in filters, SMPS, RF circuits, and chokes.
Function

An inductor stores energy in a magnetic field created by current flowing through its coil. It opposes changes in current (inertia effect). In DC circuits, it acts as a low-resistance path; at AC/high frequencies, it presents high impedance (XL = 2πfL). Used in switched-mode power supplies (buck/boost converters), EMI filters, RF tuning circuits, and chokes to block AC noise on DC lines. Measured in Henrys (H), mH, µH.

Common Failures
  • Open winding — wire break from overcurrent or physical damage
  • Shorted turns — insulation breakdown between turns, usually thermal
  • Core saturation — inductance drops when current exceeds rated value
  • Audible whine/buzz in SMPS inductors (magnetostriction)
  • Ferrite core cracking — physical damage or vibration
  • DCR increase from corroded windings
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Identification
  • Toroidal: Doughnut-shaped ferrite core with wire wound around it
  • SMD power inductor: Shielded square package (e.g., 4×4mm), value printed on body
  • Axial/radial: Coil on cylindrical core, colour-coded like resistors
  • Ferrite bead: Small SMD package, used as EMI suppressor (acts as frequency-dependent resistor)
  • PCB prefix: "L" (e.g., L1, L5)
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Quick Test Summary
  • Mode: Continuity or Ω
  • Healthy inductor: very low DCR (typically 0.01–5 Ω)
  • OL = open winding (broken wire)
  • Very high Ω = partial open or corroded
  • Use LCR meter or DMM inductance mode for µH/mH value
  • Shorted turns: hard to detect with DMM alone
Inductor Symbols & Types
Air Core
Iron Core (Ferromagnetic)
10µH
SMD Power Inductor
Toroidal Inductor
Multimeter Testing — Inductor
1
Power OFF & Discharge
Disconnect power. Inductors in switching circuits may have residual energy — short the leads momentarily through a resistor to discharge the magnetic field safely.
2
Continuity / DCR Test (Ω Mode)
Set DMM to Ω (lowest range, or continuity). Probe both inductor terminals. A healthy inductor has very low DC resistance — almost a short circuit to DC.
Small inductor: 0.1–5 Ω ✓
Power inductor: 0.01–1 Ω ✓
OL = Open winding (broken wire)
3
Inductance Test (LCR / DMM L mode)
If your DMM has an inductance mode (L), use it to compare to the rated value printed on the component. Significant deviation (especially much lower value) may indicate shorted turns.
Compare measured µH to rated value ±20%
4
Shorted Turns (Limitation)
DMM alone cannot reliably detect shorted turns — DCR may be only slightly lower. An LCR meter measuring Q-factor (quality factor) will reveal shorted turns as a dramatically reduced Q value. Thermal camera in circuit is often more practical.
Shorted turns: audible whine, excess heat on core
Passive Ω / Continuity Mode XL = 2πfL Energy in B-Field LCR Meter for Full Test
Passive Component — Category 07
Transformers
Transfer electrical energy between circuits via inductive coupling. Step up or step down voltage while providing galvanic isolation.
Function

Transformers transfer AC energy between two or more electrically isolated windings through a shared magnetic core. The voltage ratio equals the turns ratio: V1/V2 = N1/N2. Used for mains power adaptation, galvanic isolation, impedance matching in audio, gate drive isolation in SMPS, and current transformers for measurement. Only work with AC — will saturate on DC.

Common Failures
  • Burnt smell / darkening from overload or short on secondary
  • Open primary or secondary winding (continuity test fails)
  • Shorted turns — excessive current draw, hot core
  • Insulation breakdown between primary and secondary (safety hazard)
  • Core saturation from DC offset or incorrect frequency
  • Cracked bobbin / delaminated core
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Identification
  • Laminated EI core: Stacked silicon steel — large, mains-frequency transformers
  • Toroidal: Doughnut shape — low leakage flux, hi-fi audio and clean PSUs
  • Ferrite E/EE core: SMPS transformers — smaller, higher frequency
  • Pot core / RM core: RF and precision inductance
  • PCB prefix: "T" or "TR" (e.g., T1, TR2)
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Quick Test Summary
  • Mode: Ω for winding continuity & DCR
  • Mode: AC Volts for turns ratio check
  • Primary DCR: 5–50 Ω typical
  • Secondary DCR: 0.1–10 Ω typical
  • Primary-to-Secondary Ω: must be OL (isolation)
  • OL on any winding = open; low Ω winding-to-winding = insulation failure
Transformer Symbol & Core Types
PRI SEC
Transformer Symbol
P S
EI Core (SMPS)
Turns Ratio & Typical DCR
Turns ratio: V1/V2 = N1/N2 | Example: 230V primary, 12V secondary → 19:1 ratio Primary DCR: 5–50 Ω | Secondary DCR: 0.1–10 Ω Primary ↔ Secondary isolation: must read OL (>10MΩ)
Multimeter Testing — Transformer
1
Safety: Discharge & Isolate
Ensure mains is disconnected. Wait 5+ minutes for filter capacitors in associated PSU circuitry to discharge. Identify all winding terminals from schematic or by probing continuity groups.
2
Winding Continuity (Ω Mode)
Measure DC resistance of each winding. Primary should be several ohms; secondary should be low. OL on any winding means a broken wire — winding is open.
Primary: 5–50 Ω | Secondary: 0.1–10 Ω ✓
OL = Open winding — Transformer failed
3
Isolation Test (Ω Mode, High Range)
Probe between primary and secondary windings. This should read OL (or >10MΩ on a good meter) — there must be complete DC isolation between windings. Any reading below 1MΩ is a dangerous insulation fault.
Primary to Secondary: OL ✓ (isolated)
Any low reading = Insulation breakdown — UNSAFE!
4
AC Voltage Ratio Test
Apply low-voltage AC to the primary (use a Variac or bench AC supply if available). Measure secondary AC output. Ratio should match rated turns ratio. Low secondary voltage may indicate shorted turns.
Measure AC V across secondary while primary energised
Passive Ω + AC Volts Mode V1/V2 = N1/N2 Galvanic Isolation AC Only
Active Component — Category 08
Integrated Circuits (ICs)
Complete functional circuits in a single package. Op-amps, logic gates, microcontrollers, audio codecs, power management ICs, and more.
Function

An IC integrates thousands to billions of transistors, resistors, and other components onto a tiny silicon die. Types range from simple logic gates and op-amps to complex microprocessors and SoCs. All ICs require correct supply voltage(s), ground connections, and usually decoupling capacitors on their supply pins. The internal circuitry performs amplification, comparison, logic operations, signal conversion (ADC/DAC), communication, and control.

Common Failures
  • ESD damage — internal junctions destroyed by static discharge
  • Over-voltage on supply or I/O pins
  • Latch-up — CMOS ICs enter parasitic SCR state (high current, excessive heat)
  • Thermal damage from inadequate decoupling or cooling
  • BGA solder ball cracking (thermal fatigue) on large packages
  • Internal bond wire failure under vibration
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Identification
  • DIP: Rectangular dual-inline, through-hole (e.g., DIP-8, DIP-14)
  • SOIC/SOP: SMD, gull-wing leads on 2 sides
  • QFP/LQFP: SMD, leads on all 4 sides
  • BGA: Ball Grid Array — solder balls underneath
  • Pin 1 marking: Dot, notch, or chamfer on package
  • PCB prefix: "U" or "IC" (e.g., U1, IC3)
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Quick Test Summary
  • Mode: DC Volts — measure supply pins
  • Mode: Diode ⊢ — check ESD protection diodes on I/O
  • Each I/O pin to GND (Red+): expect 0.3–0.7V (ESD diode)
  • VCC to GND: must match rated supply voltage
  • Zero ohms supply-to-GND = shorted IC
  • Thermal camera: shorted IC heats up rapidly
IC Packages Reference
DIP-8 1 8
DIP-8
SOIC-8
SOIC-8 SMD
QFP
QFP Package
BGA (Bottom View)
Multimeter Testing — ICs
1
Supply Voltage Check (DC V Mode)
Power ON. Identify VCC and GND pins from datasheet. Probe VCC pin to GND. Voltage must be within rated supply range (e.g., 5V±5%, 3.3V±3%). Low supply voltage = regulator or decoupling issue, not necessarily the IC.
Supply at VCC pin = rated voltage ✓
2
I/O ESD Diode Test (Diode Mode)
Power OFF. Red probe to each I/O pin, Black to GND. Every pin should show a forward voltage drop of 0.3–0.7V (ESD protection diode to GND rail). Zero means shorted pin; OL means open ESD diode (possible ESD damage).
Each pin to GND: 0.3–0.7V ✓
Pin reads 0V to GND = Shorted I/O pin
3
Supply Short Check (Ω Mode)
Power OFF, discharged. Probe VCC to GND in resistance mode. If it reads 0–10Ω, there is a short on the supply rail. This could be the IC itself or a nearby decoupling capacitor.
VCC–GND: high resistance or OL ✓
VCC–GND: near 0Ω = IC or cap shorted
4
Thermal Camera + PSU Injection
For definitive IC fault finding: inject supply voltage through a DC PSU at current-limited (150–300mA). Use thermal camera — a faulty IC heats up within 15–30 seconds. The hottest component on the board is typically the fault.
PSU current-limiting protects board during diagnosis
Active DC V + Diode Mode ESD Sensitive DIP/SOIC/QFP/BGA Thermal Identification
REG
Active Component — Category 09
Voltage Regulators
Maintain a fixed output voltage regardless of input variation or load changes. Linear (LDO) and switching types.
Function

Voltage regulators maintain a stable, controlled output voltage from a varying input. Linear regulators (e.g., 7805, LM317, AMS1117) dissipate excess voltage as heat — simple but inefficient. Switching regulators (buck, boost, buck-boost) use inductors and capacitors with PWM switching for high efficiency (85–95%). LDO (Low Dropout) regulators work with very small input-output differences.

Common Failures
  • Thermal shutdown — overheating from excessive current or inadequate heatsinking
  • Output voltage wrong or drifting — internal reference damaged
  • Output = Input voltage — internal pass transistor shorted (pass-through failure)
  • 0V output — internal pass transistor open or input absent
  • Switching regulator: MOSFET shorted causing high current on input rail
  • Unstable output / oscillation — bad output capacitor ESR
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Identification
  • TO-220 3-pin: Classic 78xx/79xx series — Input, GND, Output
  • SOT-223 / SOT-23-5: SMD LDOs (e.g., AMS1117, AP2112)
  • Part number markings: 7805 (5V), 7812 (12V), LM317 (adj.), AMS1117-3.3
  • Switching regulator ICs: Small SMD packages with enable, FB, SW pins
  • PCB prefix: "U", "VR", or "IC" (e.g., U2, VR1)
🧪
Quick Test Summary
  • Mode: DC Volts
  • Power ON: measure output vs GND
  • Output = Input → shorted pass transistor
  • Output = 0V → open pass transistor or no input
  • Power OFF: Diode mode — output pin to GND
  • Check input pin to confirm supply voltage reaching regulator
Regulator Types & Package
IN GND OUT 7805
78xx Series (TO-220)
LDO VIN VOUT GND ↓ Vdropout
LDO Block Diagram
Common Regulator ICs
7805=5V, 7809=9V, 7812=12V, 7815=15V | 79xx = negative voltage series LM317 = adjustable (1.25–37V), set via resistors: Vout = 1.25(1 + R2/R1) AMS1117-3.3 = LDO 3.3V (SOT-223) | AP2112 = 600mA LDO (SOT-23-5)
Multimeter Testing — Voltage Regulator
1
Check Input Voltage (DC V, Power ON)
Probe the Input pin to GND. Confirm adequate input voltage is reaching the regulator. For a 5V regulator (7805), input must be at least 7V for proper regulation.
Input pin: correct supply present ✓
No input voltage = upstream power fault
2
Measure Output Voltage (DC V, Power ON)
Probe Output pin to GND. Compare to rated output. Check under load (with circuit operational) as some faults only appear under load.
Output: rated voltage ±5% ✓
Output = Input voltage = Pass transistor shorted
Output = 0V = Pass transistor open or no input
3
Diode Check (Power OFF, Diode Mode)
Probe Input-to-GND and Output-to-GND in diode mode. Should show diode characteristics (ESD diodes to GND on each pin). Output reading OL may indicate open pass element.
4
Thermal Check
Linear regulators dissipate (Vin–Vout)×Iout as heat. A cool regulator under full load may mean it's not actually passing current — check load side. An extremely hot regulator under light load = possible short on output or low-impedance load forcing high current.
Normal: warm to touch. Burning hot = investigate!
Active DC Volts Mode 78xx / LDO / SMPS Linear vs Switching VIN must exceed VOUT
Electromechanical — Category 10
Relays
Electrically-controlled mechanical switches. A small control signal switches a much larger load circuit, with electrical isolation between control and load.
Function

A relay uses an electromagnet (coil) energized by a control current to mechanically move an armature, switching one or more sets of contacts. This provides complete electrical isolation between the low-voltage control circuit and the switched load circuit. Types: SPDT, DPDT, latching, solid-state (SSR — uses a triac or MOSFET internally). Used for mains switching, automotive, industrial control, and protection circuits.

Common Failures
  • Welded/fused contacts — from switching excessive current
  • Open contacts — arcing has burned away contact material
  • Coil open circuit — winding broken (no actuation)
  • Contact resistance increase — oxidized or carbonized contacts
  • Coil not releasing — magnetic remanence or mechanical jam
  • SSR: internal TRIAC/MOSFET shorted (stays ON permanently)
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Identification
  • Through-hole: Rectangular cube with multiple pins, contact ratings printed on top
  • Miniature PCB relay: 5-pin or 8-pin DIP-style (e.g., SRD-05VDC-SL-C)
  • SSR: Semiconductor relay, often with 4 terminals in a larger housing
  • Markings: Coil voltage (5VDC, 12VDC), contact rating (10A 250VAC)
  • PCB prefix: "K" or "RLY" (e.g., K1, RLY2)
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Quick Test Summary
  • Mode: Ω for coil and contact tests
  • Coil resistance: typically 50–500 Ω (check label)
  • NC contacts (de-energised): continuity/0 Ω
  • NO contacts (de-energised): OL
  • Energise coil with rated DC voltage — NC opens, NO closes
  • Should hear click when energised/released
Relay Symbol & Contact Types
NC NO COM
SPDT Relay
5VDC
PCB Relay
Multimeter Testing — Relay
1
Coil Resistance (Ω Mode, Power OFF)
Find coil pins (usually marked on body or from datasheet). Measure resistance across coil. Compare to rated coil resistance.
5V coil: ~70–120 Ω | 12V coil: ~150–400 Ω ✓
OL = Open coil (relay won't energise)
2
Contact Test — De-energised (Ω / Continuity)
With coil NOT energised: NC (Normally Closed) contacts should beep/show 0Ω. NO (Normally Open) contacts should read OL.
NC = 0Ω | NO = OL (de-energised) ✓
3
Contact Test — Energised
Apply rated coil voltage (e.g., 5V or 12V DC to coil pins). You should hear a click. Now re-test contacts: NC should be OL, NO should be 0Ω.
Energised: NC = OL | NO = 0Ω ✓
No click or no contact change = coil or mechanism fault
4
Contact Resistance Check
When closed contacts show more than 1–2 Ω, the contacts are oxidised or arced. This causes voltage drop and heating under load. Relays with contact resistance >5Ω under moderate load should be replaced.
Healthy closed contacts: <0.5 Ω
Electromechanical Ω + Continuity Mode NC / NO / COM Isolated Control Listen for Click
Passive/Active — Category 11
Crystals & Oscillators
Precision frequency reference elements. Quartz crystals provide highly stable clock signals for microcontrollers, processors, and communication circuits.
Function

A quartz crystal exploits the piezoelectric effect — mechanical vibration at a precise resonant frequency when AC voltage is applied. Used with an oscillator amplifier circuit (internal to microcontrollers, or an external inverter gate) to produce a highly stable clock frequency. TCXO (temperature-compensated) and VCXO (voltage-controlled) variants offer higher stability. Crystal oscillator modules contain the crystal plus oscillator circuit and output a square wave directly.

Common Failures
  • Crystal cracked or fractured — physical shock or ESD
  • Frequency drift — aging, temperature, or contamination
  • No oscillation — damaged crystal, wrong load capacitors, or MCU oscillator damaged
  • Crystal sealed in metal can: verify by observing oscilloscope output, not DMM
  • PCB trace damage — crystal traces are sensitive to stray capacitance
  • Oscillator module: internal circuit failure (no output)
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Identification
  • HC-49/U: Through-hole, metal can, 2 pins, most common
  • SMD Crystal: Small rectangular package (3225, 2016, 1612 sizes)
  • XTAL Oscillator module: 4-pin DIP module (VCC, GND, Output, optional Enable)
  • Frequency marked: e.g., "16.000" = 16MHz, "32.768" = 32.768kHz (RTC)
  • PCB prefix: "Y", "X", "XTAL" (e.g., Y1, X2)
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Quick Test Summary
  • DMM has limited use for crystal testing
  • Ω mode: should read OL or very high resistance
  • 0 Ω = physically cracked/shorted crystal
  • Best test: oscilloscope on MCU crystal pins
  • Oscillator module: DC V at output pin (should toggle between 0V and VCC)
  • Replacement with known-good crystal is fastest diagnostic
Crystal Symbol & Packages
Crystal Symbol
16MHz
HC-49 Crystal
XTAL MODULE 16.000
Oscillator Module
Multimeter Testing — Crystal
1
Resistance Check (Ω Mode)
With power OFF, probe both crystal pins in Ω mode. A healthy crystal should read very high resistance or OL — it is not a conductor under DC conditions.
Both pins: OL or >1MΩ ✓
Near 0Ω = Crystal cracked/shorted — Replace
2
Oscillator Module Output (DC V, Power ON)
For a 4-pin crystal oscillator module: probe the OUTPUT pin to GND with DMM on DC Volts. An oscillating signal reads as approximately half the supply voltage (e.g., ~2.5V on a 5V module) due to the DMM averaging the square wave.
Output ≈ VCC/2 (2.5V on 5V module) = Oscillating ✓
Output = 0V or = VCC = No oscillation
3
MCU Crystal Pins (AC V Mode or Scope)
A crystal connected to an MCU oscillator can be checked by probing the MCU's XTAL1/XTAL2 pins on AC volts mode — a small AC voltage (<1V) should be measurable when the crystal is oscillating. Oscilloscope is far more reliable for this.
Best test: oscilloscope — look for sine/clipped wave at crystal frequency
4
Practical Tip: Substitution
For SMD crystals and embedded MCU oscillators, a known-good replacement crystal is usually faster than DMM testing. If device starts working after substitution — the crystal was faulty. Also check the two load capacitors (typically 12–22pF) near the crystal with capacitance mode.
Check load caps near crystal: expect 12–22pF ✓
Piezoelectric Limited DMM Use Oscilloscope Preferred 32.768kHz RTC / MHz CPU Load Caps 12–22pF
Protection Component — Category 12
Fuses, PTC Resettable Fuses & TVS Diodes
Circuit protection devices that prevent damage from overcurrent, overvoltage, and transient events. The circuit's last line of defence.
Function

Fuses sacrifice themselves — a wire element melts and opens the circuit when current exceeds rated value. PTC (Polyfuse) resettable fuses increase resistance dramatically when heated by overcurrent, limiting current until the fault is removed, then self-reset. TVS Diodes (Transient Voltage Suppressors) clamp voltage spikes to a safe level in nanoseconds, protecting sensitive ICs from ESD and inductive kickback. All are critical for reliable, safe circuit design.

Common Failures
  • Fuse: opens (expected if doing its job — find root cause!)
  • Fuse: nuisance blowing from an undersized fuse rating
  • PTC: fails to reset (remains in high-resistance trip state)
  • PTC: resistance too high permanently (aged component)
  • TVS: shorted from an exceptionally large transient — protects the circuit by failing short
  • TVS: clamping voltage drifts out of spec (aging)
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Identification
  • Glass tube fuse: Transparent cylinder — wire element visible (5×20mm or 3AG)
  • Ceramic fuse: Opaque white/beige cylinder — must test with DMM
  • SMD fuse: 1206/0603 chip, marked with current/voltage rating
  • PTC/Polyfuse: Flat yellow/black SMD disc or through-hole disc
  • TVS diode: Similar to Zener, marked DO-214AA/SMA or SOD-123
  • PCB prefix: "F" (fuse), "D" (TVS), "PTC"
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Quick Test Summary
  • Mode: Continuity 🔊 for fuses
  • Fuse intact: beep / 0 Ω
  • Fuse blown: OL
  • PTC (cooled): <1 Ω. PTC (tripped/hot): kΩ range
  • TVS: Diode mode — like a Zener diode response
  • NEVER replace fuse without finding root cause!
Fuse Symbols & Physical Types
Fuse Symbol
INTACT
Glass Fuse — Intact
BLOWN
Glass Fuse — Blown
TVS Diode (Bidirectional)
TVS Diode
Multimeter Testing — Fuses & Protection
1
Fuse Test (Continuity Mode, Power OFF)
Remove fuse from circuit or at least test in-circuit with power OFF. Probe both ends in continuity mode.
Beep / 0Ω = Fuse intact ✓
OL = Fuse blown — Find root cause before replacing!
2
PTC Polyfuse Test (Ω Mode)
Measure resistance across a cooled PTC fuse in Ω mode. It should be very low (much less than 1Ω). If the PTC was recently in a fault condition, allow 10 minutes to cool before testing.
Cooled PTC: <1Ω ✓
Warm/tripped PTC: kΩ range — allow to cool and retest
3
TVS Diode Test (Diode Mode)
Probe TVS diode in diode mode (like a Zener). Forward: ~0.6–0.7V. Reverse: OL. A bidirectional TVS reads ~0.6–0.7V in both directions (two back-to-back Zeners inside).
Unidirectional TVS: Fwd 0.6V, Rev OL ✓
Bidirectional TVS: ~0.6V in both directions ✓
TVS reads 0V both directions = Shorted (but may have sacrificed itself saving the circuit!)
4
Root Cause Investigation
A blown fuse or shorted TVS is a symptom, not the root cause. Use the DC PSU at current-limited voltage to inject into the protected rail and find the downstream fault that caused the overcurrent/overvoltage event.
PSU + thermal camera = locate the real fault
Protection Continuity Mode Find Root Cause First Fast-Blow / Slow-Blow TVS = Voltage Clamp
Reference Guide — Appendix
DMM Mode Quick-Reference
Which DMM mode to use for each test objective. Master this table and you can test any component confidently.
DMM Mode Symbol Power State What You're Testing PASS Reading FAIL Reading
DC Voltage V̄ / VDC ON ⚠ Supply rails, voltage regulator output, battery voltage, logic signal levels Rated value ±5% 0V or >spec
AC Voltage V~ / VAC ON ⚠ Mains voltage, transformer secondaries, oscillator output amplitude 230V mains / sec rated V 0V = no output
Resistance Ω OFF Resistor values, winding DCR, contact resistance, cable resistance Within tolerance of rated value OL=open; 0Ω=short
Continuity 🔊 / →|← OFF PCB trace integrity, fuse condition, relay contacts, connector pins, cable continuity Beep / <10Ω OL = broken track/fuse
Diode Test ⊢ / →| OFF Diodes, BJT junctions, MOSFET body diode, IC ESD diodes, LED polarity Fwd: 0.3–0.7V; Rev: OL 0V=short; OL both=open
Capacitance –|– / F OFF + discharged Capacitor value verification, detecting dried-out or degraded capacitors 80–120% of rated value <70% = degraded
DC Current A / mA ON (series) ⚠ Board quiescent current, LED current, motor current, charger current Within spec idle/load range Excessive = fault/short
hFE (Transistor) hFE / β OFF (DMM powers it) BJT current gain (beta), NPN/PNP socket test 100–500 for small signal BJTs 0 or very low = damaged
⚠ Always power OFF before switching DMM mode ⚠ Use correct current port for mA/A mode ⚠ Never measure resistance in a live circuit